Technical Papers

Proceeding presented at SPIE 2006:

Proceeding presented at SPIE 2008:

See transfer of copyright to SPIE.

High-precision CTE measurement of aluminum-alloys for croygenic astronomical instrumentation, I. Mochi et al.,Exp. Astr.

Inventario e memorandum del Software di Controllo, E. Rossetti

Giano Preslit Document V 3.0, T. Oliva, L. Origlia


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